- Manufacturer:
-
- Texas Instruments (20)
- Maxim Integrated (3)
- ON Semiconductor (1)
- Operating Temperature:
-
- Package / Case:
-
- Supplier Device Package:
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- Supply Voltage:
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- Logic Type:
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29 Records
Image | Part | Manufacturer | Description | Stock | Action | |
---|---|---|---|---|---|---|
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Maxim Integrated | IC DCL DUAL 500MBP... |
5,000
In-stock
|
|||
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Maxim Integrated | IC COMPARATOR R-R... |
5,000
In-stock
|
|||
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Texas Instruments | IC 18-BIT TTL/BTL X... |
5,000
In-stock
|
|||
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Texas Instruments | IC SCAN TEST DEVI... |
5,000
In-stock
|
|||
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Texas Instruments | IC SCAN-TEST-DEV/... |
5,000
In-stock
|
|||
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Texas Instruments | IC LINK ADDRSS SC... |
5,000
In-stock
|
|||
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Texas Instruments | IC 20BIT UNIV BUS ... |
5,000
In-stock
|
|||
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IDT, Integrated Device Technology Inc | IC BUFFER 14BIT RE... |
5,000
In-stock
|
|||
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IDT, Integrated Device Technology Inc | IC BUFFER 28BIT 1:2... |
5,000
In-stock
|
|||
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IDT, Integrated Device Technology Inc | IC BUFFER 25BIT RE... |
5,000
In-stock
|
|||
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IDT, Integrated Device Technology Inc | IC BUFFER DDR 13-26... |
5,000
In-stock
|
|||
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IDT, Integrated Device Technology Inc | IC BUFFR 28BIT REG... |
5,000
In-stock
|
|||
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Texas Instruments | IC SCAN-TEST-DEV/... |
37
In-stock
|
|||
![]() |
Texas Instruments | IC SCAN-TEST-DEV/... |
245
In-stock
|
|||
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Texas Instruments | IC 17BIT UNIV STRG... |
688
In-stock
|
|||
![]() |
Texas Instruments | IC SCAN-TEST-DEV/... |
291
In-stock
|
|||
![]() |
Texas Instruments | IC SCAN-TEST-DEV/... |
314
In-stock
|
|||
![]() |
Texas Instruments | IC SCAN-TEST-DEV/... |
457
In-stock
|
|||
![]() |
Texas Instruments | IC SCAN-TEST-DEV/... |
292
In-stock
|
|||
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Texas Instruments | IC SCAN TEST DEVI... |
299
In-stock
|